SanjSCOPE™ NT220

Industry-Leading Thermal Imaging for Semiconductor & Device Analysis

The SanjSCOPE™ NT220 is Microsanj’s flagship thermoreflectance imaging system, delivering sub-micron spatial resolution and nanosecond-scale transient thermal analysis. Designed for semiconductor failure analysis, RF device characterization, and advanced materials research, the NT220 offers unmatched precision and speed for identifying and analyzing thermal behavior at the microscale.

Key Features & Benefits

Ultra-High Spatial Resolution – Down to 250nm for detailed thermal mapping.
Nanosecond-Scale Thermal Analysis – Capture fast transient thermal events.
Advanced Failure Analysis – Detect hotspots, thermal gradients, and device defects.
Non-Destructive Testing – Ideal for semiconductors, RF, and photonics.
Seamless System Integration – Compatible with optical pump-probe techniques and multi-layer device testing.

Applications

Semiconductor Packaging & ICs – Optimize chip performance and reliability.
RF & 5G/6G Devices – Thermal management for power amplifiers and antennas.
Power Electronics – Ensure efficiency in GaN, SiC, and IGBT components.
Photonics & Optoelectronics – Analyze laser diodes, LEDs, and optical interconnects.

Technical Specifications

Why Choose SanjSCOPE™ NT220?

Designed for R&D labs, semiconductor manufacturers, and research institutions, the NT220 provides unparalleled thermal characterization capabilities. With high-speed data acquisition, superior resolution, and user-friendly software, it is the ultimate solution for next-generation thermal analysis.