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EZ-THERM™-SERIES
Modular Bench-Top Thermal Imager
EZ500 Platform
Portable & Connect to existing test station
Key features :-
- Modular approach – add as needed
- Simultaneously support up to 3 sensors TR & IR
- Transient Resolution: 50 μs or 5 μs
- Pixel-by-pixel calibration with up 50W cooling capacity
NANOTHERM-SERIES
Nanosecond Transient Thermal Imagers
NT220 Series
NUV to VIS CMOS or SCMOS for top-side imaging & InGaAs NIR for back-side imaging
Key features :-
- Transient Resolution: 50 ns
- Support up to 3 Sensors & Dual mode (TR + IR) functionality
- Pixel by pixel calibration with up to 500W cooling capacity
PICOTHERM-SERIES
Picosecond Transient Thermal Imager
PT410
Ultra-fast transient response for thermal research analysis
Key features :-
- Transient Resolution: 500 ps
- SCMOS Sensor (5 MP)
- 300 to 1064 nm spectral range
- Spatial Resolution: 325 nm with 455 nm illumination
- Pulsed diode laser
All SanjSCOPE™ Thermal Imaging Systems include SanjCONTROLLER™ with embedded User-Friendly SanjVIEW™ , SanjIMAGER™, and SanjANALYZER™ software modules with optional upgrade to SanjANALYZER-PLUS™
Microsanj Products Overview
Microsanj’s cutting-edge product portfolio delivers high-resolution thermal imaging, device analysis, materials characterization, and advanced system diagnostics. Designed to meet the evolving demands of semiconductors, photonics, electronics, and cutting-edge research, our solutions provide precise thermal analysis and performance optimization for next-generation technologies.
Thermoreflectance Imaging
SanjSCOPE™ NT220
Flagship thermoreflectance imaging system offering 250nm spatial resolution and sub-nanosecond temporal analysis for high-performance semiconductor testing.
SanjSCOPE™ EZ500
Cost-effective entry-level thermoreflectance imaging system designed for broad accessibility without compromising essential performance.
Infrared Imaging
irSCOPE™ EZ100A
Infrared-based thermal imaging for general-purpose applications across a wide range of industries.
irSCOPE™ EZ100A OpenTEST™
Enhanced infrared imaging system featuring integrated open-circuit detection, ideal for fault isolation and failure analysis.
Specialized Enhancements
OPP-3DIC™
Advanced Optical Pump-Probe upgrade for the NT220 system, designed for 3DIC thermal analysis, complex packaging architectures, thin-film characterization, and process integrity assessment.
PicoSCOPE™
500-picosecond upgrade for the SanjSCOPE™ NT220, enabling enhanced microscopic thermal analysis for high-speed applications.
POSH-TDTR™
Laser-based time-domain thermoreflectance system for bulk and thin-film thermal materials characterization. Designed as a standalone solution for high-precision materials analysis.
irFLASH™
Non-invasive lock-in infrared thermography system operating in the low-wavelength infrared (LWIR) band, optimized for FLASH Thermography analysis of heterogeneous 3D structures.
IR+TR Hybrid System – Infrared + Thermoreflectance
Combines both methods for comprehensive thermal mapping.
Software
SanjView™ Software
SanjVIEW™ is Microsanj’s powerful thermal imaging and analysis software, designed to provide high-resolution, real-time visualization of temperature distributions.
SanjANALYZER-PLUS™ Software
SanjANALYZER-PLUS™ is a standalone software option for the Microsanj NanoTherm series thermoreflectance thermal analyzers.
Advanced User Interface
SanjVIEW and SanjANALYZER
- Highest SPATIAL Resolution
- Hyperspectral Pixel-by-Pixel Calibration
- Fast TRANSIENT THERMAL Response
- Lock-In TR for high S/N
- Auto-Focus & Auto-Positioning
- Absolute Temperature measurement
- Near-UV to Near-IR wavelengths
- Adaptable to existing lab hardware
- Macro to Nano Field of View (FOV)